MC8640HJ1250HE
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| NXP Semiconductors | ||
| Product content declaration of MC8640HJ1250HE | Last Revision (GMT): Monday, 13 May 2024, 05:45:00 AM | |
| Part Type | Package Version | Package Name | Total part weight | Environment | Termination | 2nd Level Interconnect | For more information: | |||
|---|---|---|---|---|---|---|---|---|---|---|
| Halogen Free (Cl+Br) | Lead Free (Pb) | EU RoHS Compliant | Plating | Base Alloy | ||||||
| MC8640HJ1250HE | SOT1609-2 | CFBGA994 | 5860.760700 mg | No | No | No | Tin/Lead (Sn10Pb90) | Other | e0 | contact us |
| Manufacturer Part Number (MPN) | Effective Date | Version | Pb-free soldering | SnPb soldering | Number of processing cycles | Manufacturing | ||||
|---|---|---|---|---|---|---|---|---|---|---|
| Moisture Sensitivity Level / Floor Life | Peak Package temperature | Max time at peak temperature | Moisture Sensitivity Level / Floor Life | Peak Package temperature | Max time at peak temperature | |||||
| 9353 436 59557 | 2023-11-24 | 13 | Not Applicable | Not Applicable | Not Applicable | 3 / 168 hours | 245 | 30 sec. | 3 | Kuala Lumpur, Malaysia |
| Subpart | Homogeneous Material | Substance | CAS number | Mass(mg) | Mass(%) of Material | Mass(%) of Total part | |
|---|---|---|---|---|---|---|---|
| Category | Description | ||||||
| Capacitor | Capacitor | Barium and its compounds | Barium titanate | 12047-27-7 | 95.614800 | 65.400000 | 1.631440 |
| Copper and its compounds | Copper, metal | 7440-50-8 | 20.175600 | 13.800000 | 0.344249 | ||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 28.509000 | 19.500000 | 0.486439 | ||
| Tin and its compounds | Tin, metal | 7440-31-5 | 1.900600 | 1.300000 | 0.032429 | ||
| Subtotal | 146.200000 | 100.0000000 | 2.494557 | ||||
| Ceramic Substrate | Ceramic Substrate | Aluminum and its compounds | Aluminum Oxides (Al2O3) | 1344-28-1 | 106.696956 | 2.722000 | 1.820531 |
| Barium and its compounds | Barium oxide | 1304-28-5 | 636.869505 | 16.247500 | 10.866670 | ||
| Boron and its compounds | Boron oxide | 1303-86-2 | 140.281802 | 3.578800 | 2.393577 | ||
| Calcium and its compounds | Calcium monoxide | 1305-78-8 | 77.525804 | 1.977800 | 1.322794 | ||
| Chromium and Chromium III compounds | Dichromium trioxide | 1308-38-9 | 13.582107 | 0.346500 | 0.231746 | ||
| Copper and its compounds | Copper, metal | 7440-50-8 | 496.231001 | 12.659600 | 8.467007 | ||
| Copper and its compounds | Cuprous oxide | 1317-39-1 | 3.135840 | 0.080000 | 0.053506 | ||
| Gold and its compounds | Gold, metal | 7440-57-5 | 2.297003 | 0.058600 | 0.039193 | ||
| Inorganic Silicon compounds | Silicon dioxide | 7631-86-9 | 2347.015528 | 59.875900 | 40.046261 | ||
| Lead and its compounds | Lead, metallic lead and lead alloys | 7439-92-1 | 0.039198 | 0.001000 | 0.000669 | ||
| Magnesium and its compounds | Magnesium-oxide | 1309-48-4 | 3.135840 | 0.080000 | 0.053506 | ||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 15.879110 | 0.405100 | 0.270939 | ||
| Palladium and its compounds | Palladium, metal | 7440-05-3 | 0.195990 | 0.005000 | 0.003344 | ||
| Phosphorus compounds | Phosphorus, elemental (not containing red allotrope) | 7723-14-0 | 1.567920 | 0.040000 | 0.026753 | ||
| Strontium and its compounds | Strontium Oxide | 1314-11-0 | 8.372693 | 0.213600 | 0.142860 | ||
| Titanium and its compounds | Titanium (IV) Oxide | 13463-67-7 | 0.062717 | 0.001600 | 0.001070 | ||
| Zinc and its compounds | Zinc oxide | 1314-13-2 | 0.050957 | 0.001300 | 0.000870 | ||
| Zirconium and its compounds | Zirconium oxide | 1314-23-4 | 66.860029 | 1.705700 | 1.140808 | ||
| Subtotal | 3919.800000 | 100.0000000 | 66.882103 | ||||
| Semiconductor Die | Semiconductor Die | Inorganic Silicon compounds | Silicon, doped | 287.406963 | 89.600000 | 4.903919 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 2.886900 | 0.900000 | 0.049258 | |||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 1.603833 | 0.500000 | 0.027366 | ||
| Silver and its compounds | Silver, metal | 7440-22-4 | 1.010415 | 0.315000 | 0.017240 | ||
| Tin and its compounds | Tin, metal | 7440-31-5 | 27.858588 | 8.685000 | 0.475341 | ||
| Subtotal | 320.766700 | 100.0000000 | 5.473124 | ||||
| Solder Ball - High Lead | Solder Ball - High Lead | Lead and its compounds | Lead, metallic lead and lead alloys | 7439-92-1 | 1130.753177 | 89.570000 | 19.293625 |
| Tin and its compounds | Tin, metal | 7440-31-5 | 131.670823 | 10.430000 | 2.246651 | ||
| Subtotal | 1262.424000 | 100.0000000 | 21.540275 | ||||
| Solder Flux | Solder Flux | Copper and its compounds | Copper, metal | 7440-50-8 | 51.531000 | 96.500000 | 0.879255 |
| Silver and its compounds | Silver, metal | 7440-22-4 | 1.602000 | 3.000000 | 0.027334 | ||
| Tin and its compounds | Tin, metal | 7440-31-5 | 0.267000 | 0.500000 | 0.004556 | ||
| Subtotal | 53.400000 | 100.0000000 | 0.911145 | ||||
| Solder Paste | Solder Paste | Lead and its compounds | Lead, metallic lead and lead alloys | 7439-92-1 | 31.649800 | 37.000000 | 0.540029 |
| Tin and its compounds | Tin, metal | 7440-31-5 | 53.890200 | 63.000000 | 0.919509 | ||
| Subtotal | 85.540000 | 100.0000000 | 1.459537 | ||||
| Underfill | Underfill | Aromatic amines and their salts | 4,4'-Methylenebis(2-ethylbenzenamine) | 19900-65-3 | 7.989300 | 11.000000 | 0.136319 |
| Bismuth and its compounds | Bismuth nitrate | 10361-44-1 | 0.072630 | 0.100000 | 0.001239 | ||
| Bismuth and its compounds | Bismuth trioxide | 1304-76-3 | 0.581040 | 0.800000 | 0.009914 | ||
| Epoxy Resins | 1,6-Bis(2,3-epoxypropoxy) naphthalene | 27610-48-6 | 10.168200 | 14.000000 | 0.173496 | ||
| Epoxy Resins | Other Epoxy resins | 2.905200 | 4.000000 | 0.049570 | |||
| Epoxy Resins | Phenolic Polymer Resin, Epikote 155 | 9003-36-5 | 7.263000 | 10.000000 | 0.123926 | ||
| Inorganic Silicon compounds | Silica, vitreous | 60676-86-0 | 43.578000 | 60.000000 | 0.743555 | ||
| Inorganic compounds | Carbon Black | 1333-86-4 | 0.072630 | 0.100000 | 0.001239 | ||
| Subtotal | 72.630000 | 100.0000000 | 1.239259 | ||||
| Total | 5860.760700 | 100.0000000 | 100.0000000 | ||||
| Note(s): |
|---|
| 1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available |
| Disclaimer |
|---|
| All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |
| NXP Semiconductors | ||
| 产品内容声明 MC8640HJ1250HE Product content declaration of MC8640HJ1250HE | 上次修订 Last Revision (GMT): Monday, 13 May 2024, 05:45:00 AM | |
| 部件名称 Name of the part | 均质材料 Homogeneous Material | 有毒或有害物质和元素 (Toxic or hazardous Substances and Elements) | |||||
|---|---|---|---|---|---|---|---|
| 铅(Pb) | 镉(Cd) | 汞(Hg) | 六价铬(Cr-VI) | 多溴联苯(PBB) | 多溴二苯醚(PBDE) | ||
| 电容器 Capacitor | 电容器 Capacitor | O | O | O | O | O | O |
| 陶瓷基板 Ceramic Substrate | 陶瓷基板 Ceramic Substrate | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| 焊球 - 高铅 Solder Ball - High Lead | 焊球 - 高铅 Solder Ball - High Lead | X | O | O | O | O | O |
| 助焊剂 Solder Flux | 助焊剂 Solder Flux | O | O | O | O | O | O |
| 焊锡膏 Solder Paste | 焊锡膏 Solder Paste | X | O | O | O | O | O |
| 底注 Underfill | 底注 Underfill | O | O | O | O | O | O |
| O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。 |
| O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit. |
| X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。 |
| X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006. |
| 备注： 该半导体产品的环保使用期限（EFUP）为50年。 |
| Remark: This semiconductor product has an environmental friendly use period (EFUP) of 50 years. |
| 免责声明 Disclaimer |
|---|
| 本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而，恩智浦不对该等信息的精确性和完整性给予任何陈述和保证，且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改，无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约，或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。 All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |
| NXP Semiconductors | ||
| Compliance Documentation of MC8640HJ1250HE | Last Revision (GMT): Monday, 13 May 2024, 05:45:00 AM | |
| Subpart | Homogeneous Material | Certificate of Analysis(CoA) | |||
|---|---|---|---|---|---|
| RoHS | Phthalates * | Halogens * | Antimony * | ||
| Capacitor | CERAMIC | Test Report 27 Nov 2023 | Test Report 27 Nov 2023 | Test Report 27 Nov 2023 | Test Report 27 Nov 2023 |
| INNER ELECTRODE | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | |
| NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 25 Jun 2021 | |
| OUTER ELECTRODE | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | |
| SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 4 Jun 2021 | Test Report 4 Jun 2021 | |
| Ceramic Substrate | Not Available | Not Available | Not Available | Not Available | |
| Semiconductor Die | Test Report 6 Mar 2024 | Test Report 6 Mar 2024 | Test Report 28 Mar 2023 | Test Report 28 Mar 2023 | |
| Solder Ball - High Lead | Not Available | Not Available | Not Available | Not Available | |
| Solder Flux | Test Report 11 Aug 2021 | Test Report 11 Aug 2021 | Test Report 11 Aug 2021 | Test Report 11 Aug 2021 | |
| Solder Paste | Not Available | Not Available | Not Available | Not Available | |
| Underfill | Test Report 12 Oct 2023 | Test Report 12 Oct 2023 | Test Report 12 Oct 2023 | Test Report 12 Oct 2023 | |
| For more information: contact us | |||||
| Note(s): |
|---|
| * NXP does not commit to providing this report for all product materials! |
| Disclaimer |
|---|
| All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |